Phys. Rev. B 61(2), XXXX (2000).
Infrared spectroscopic ellipsometry is used for analysis of the anisotropic dielectric functions of sapphire. The ordinary and extraordinary complex dielectric functions and infrared-active phonon modes are measrued for wavelengths from 3 to 30 micrometer. A factorized form of the dielectric function is employed for best-fit calculation of the infrared ellipsometry spectra adjusting frequencies and damping parameters of the transverse and longitudinal phonon modes with A2u and Eu symmetry separately. A generalized Lowndes condition for the damping parameters is derived and found satisfied for the A2u and Eu branches. Excellent agreement with phonon mode literature values is obtained, and improper use of selection rules reported previously for calculation of the sapphire dielectric functions is revised [Harman et al., J. Appl. Phys. 76, 8032 (1994)].
Contributed by M. Schubert from ee-dthompson19.unl.edu. on Friday, March 3, 2000 4:34:40 PM
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