Data for reference schubert-tsf-313-323

Generalized ellipsometry and complex optical systems

M. Schubert

Thin Solid Films 313, 323 (1998).

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This item is cited by the following items in the database:

  1. Optical phonons and free-carrier effects in MOVPE grown AlxGa1-xN measured by Infrared Ellipsometry

Contributed by A submitted manuscript, on Tuesday, September 28, 1999 11:06:40 PM

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