Data for reference freitas-solstelectr-41-185

Optical and magnetic resonance characterization of undoped and doped Wurtzite GaN films deposited on sapphire substrates,

J. A. Freitas, T. A. Kennedy, E. R. Glaser, W. E. Carlos

Solid State Electronics 41, 185 (1997).

The Materials Research Society does not yet have permission from the copyright owner to make the abstract available.

This item is cited by the following items in the database:

  1. Nonuniform Morphology and Luminescence Properties of a Molecular Beam Epitaxy GaN Film from Atomic Force Microscopy, Scanning Electron Microscopy and Cathodoluminescence

Contributed by A submitted manuscript, on Thursday, May 22, 1997 4:13:43 PM

If you are a registered user, and would like to help the journal improve its references database, you can help by adding data to the database. The author list may be incomplete; the abstract or title may be missing, and the list of references cited by the article is probably absent or incomplete.

MRS Internet Journal of Nitride Semiconductor Research

last updated Thursday, April 28, 2005 11:55:01 AM.
© 1998 The Materials Research Society