schibli-solstelectr-11-323

Data for reference schibli-solstelectr-11-323

Effects of Deep Impurities on n+p Junction Reverse-biased Small-Signal Capacitance

E. Schibli, A. G. Milnes

Solid State Electronics 11, 323 (1968).

This paper gives an interpretation of C-V measurements in semiconductors.

This item is cited by the following items in the database:

Solar-Blind AlGaN Heterostructure Photodiodes

Contributed by A submitted manuscript, on Wednesday, September 13, 2000 6:38:50 PM

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