Data for reference siegle-solstcomm-96-943

Quantitative determination of hexagonal minority phase content in cubic GaN using Raman spectroscopy

H. Siegle, L. Eckey, A. Hoffmann, C. Thomsen, B. K. Meyer, D. Schikora, M. Hankeln, K. Lischka

Solid State Communications 96(12), 943 (1995).

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This item cites the following items in the database:

  1. Quantitative determination of hexagonal minority phase content in cubic GaN using Raman spectroscopy

This item is cited by the following items in the database:

  1. Quantitative determination of hexagonal minority phase content in cubic GaN using Raman spectroscopy
  2. Gain Spectroscopy of HVPE-Grown GaN
  3. Crystalline Structure changes in GaN Films Grown at Different Temperatures
  4. Raman characterization of the optical phonons in AlxGa1-xN layers grown by MBE and MOCVD

Contributed by L. Eckey from server05.zrz.tu-berlin.de. on Tuesday, January 7, 1997 12:39:19 PM

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