References with etch in the title or abstract
- Electrolytic etching of GaN
- Etching of GaN using phosphoric acid
- Dry and wet etching characteristics of InN, AlN, and GaN deposited by electron cyclotron resonance
metalorganic molecular beam epitaxy Dry and wet etching characteristics of InN, AlN, and GaN
- Low bias electron cyclotron resonance plasma etching of GaN, AlN, and InN
- Dry patterning of InGaN and InAlN
- Dry Etching of Thin Film InN, AiN and GaN
- Hydrogen incorporation in GaN, AIN, and InN during Cl2/CH4/H2/Ar ECR plasma etching
- Dry Etching and Implantation Characteristics of Iii-n Alloys
- Chemically Assisted Ion Beam Etching of Gallium Nitride
- Reactive Ion Etching of Gallium Nitride Using Hydrogen Bromide Plasmas
- Characteristics of chemically assisted ion beam etching of gallium nitride
- Reactive ion etching of gallium nitride in silicon tetrachloride plasmas
- Ar+-ion milling characteristics of III-V nitrides
- Ecr Plasma Etching of GaN, AlN and Inn Using Iodine or Bromine Chemistries
- SiC-a(3)n Alloys and Wide Band Gap Nitrides Grown on SiC Substrates
- X-Band Thin Film Acoustic Filters on GaAs
- Electron Cyclotron resonance etch characteristics of GaN in SiCl4/Ar
- Electric breakdown in GaN p-n junctions
- Photoassisted dry etching of GaN
- Dry etching of gallium nitride using CCl2F2, CCl4 and air.
- InGaN-Based Multi-Quantum-Well-Structure Laser Diodes
- AlGaN pn junctions
- Reactive ion etching of GaN using BCl3
- Study of chemically assisted ion beam etching of GaN using HCl gas
- Magnetron reactive ion etching of group III-nitride ternary alloys
- High density plasma etching of III- V nitrides.
- Patterning of AlN, InN, and GaN in KOH-based solutions
- Unintentional hydrogenation of GaN and related alloys during processing Unintentional hydrogenation
during processing
- Very low resistance multilayer Ohmic contact to n- GaN
- Room-temperature photoenhanced wet etching of GaN
- Electron cyclotron resonance etching characteristics of GaN in SiCl4/Ar
- The influence of CH4/H2/Ar plasma etching on the conductivity of n-type gallium nitride
- Dry etch damage in InN, InGaN, and InAlN
- High rate electron cyclotron resonance etching of GaN, InN, and AlN High rate electron cyclotron
resonance
- Reactive ion etching of GaN using CHF3/Ar and C2ClF5/Ar plasmas
- Nanoscale structures in III-V semiconductors using sidewall masking and high ion density dry etching
Nanoscale structures in III-V semiconductors
- High etch rates of GaN with magnetron reactive ion etching in BCl3 plasmas
- CCl4 doping of GaN grown by metalorganic molecular beam epitaxy
- High temperature electron cyclotron resonance etching of GaN, InN, and AlN
- Deep implantation of nitrogen into GaAs for selective three-dimensional microstructuring
- Photoemission study of nitrogen-implanted GaAs surfaces
- Inductively coupled plasma etching of GaN
- Optical patterning of GaN films
- Room temperature epitaxy of Pd films on GaN under conventional vacuum conditions
- ICl/Ar electron cyclotron resonance plasma etching of III-V nitrides
- Realization of optically pumped second-order GaInN-distributed-feedback lasers
- Reactive Fast Atom Beam Etching of a Wide-gap Semiconductor GaN
- ECR RIE-Enhanced Low Pressure Plasma Etching of GaN/InGaN/AlGaN
Heterostructures
- Fabrication of GaN mesa structures
- The Incorporation of Hydrogen into III-V Nitrides During Processing
- Cl2/Ar and CH4/H2/Ar dry etching of III-V nitrides
- Dry Etching of GaN Using Chemically Assisted Ion Beam Etching with HCl and H2/Cl2
- Reactive Ion Etching of Gallium Nitride Films
- Silver Schottky contacts on Si(111):H-1x1 surfaces prepared bywet-chemical etching
- GaN Layers Grown by HVPE on P-type 6H-SiC Substrates
- Effects of reactive ion etching on the electrical properties of n-GaN surfaces
- Dry Etching of AlxGa1-xN using Chemically Assisted Ion Beam Etching
- Etching processes for fabrication of GaN/InGaN/AlN microdisk laser structures
- Characterization of reactive ion etching-induced damage to n-GaN surfaces using Schottky diodes
- Photoassisted Anodic Etching of Gallium Nitride
- Reactive Ion Etching of Silicon Carbide with Fluorine-Containing Plasmas
- Highly Anisotropic, Ultra-Smooth Patterning of GaN/SiC by Low Energy Electron Enhanced Etching in DC Plasma
- Theoretical Study of the Surface Reaction Mechanism of GaN with HCl
- Dislocation Etch Pits in GaN Epitaxial Layers Grown on Sapphire Substrates
- High-density plasma etching of compound semiconductors
- Plasma etching of III-nitrides in ICl/Ar and IBr/Ar plasmas
- Electron cyclotron resonance etching of III–V nitrides in IBr/Ar plasmas
- High Frequency AlGaN/GaN MODFET's
- New Precursor Routes to Nanocrystalline Cubic/Hexagonal Gallium Nitride, GaN
- Characteristics of Indium-Gallium-Nitride Multiple-Quantum-Well Blue Laser Diodes Grown by MOCVD
- Effects of Dissolved Oxygen on Anodic Etching of n-Type GaN Films Using a Sodium Hydroxide Electrolyte
- Physical Properties of Bulk GaN Crystals Grown by HVPE
- GaN based LED's with different recombination zones
- Effect of Dry Etching on Surface Properties of III-Nitrides
- Thermodynamic Study on Metalorganic Vapor-Phase Epitaxial Growth of Group III Nitrides
- High rate and selective etching of GaN, AlGaN, and AlN using an inductively coupled plasma
- Quasi-Thermodynamic Analysis of Metalorganic Vapor- Phase Epitaxy of GaN
- Polar-Twinned Defects in LiGaO2 Substrates Lattice Matched With GaN
- A Chemical and Structural Study of the AlN-Si Interface
- Processing Challenges for GaN-Based Photonic and Electronic Devices
- Photoelectrochemical Etching of GaN
- Patterning of GaN in High-Density Cl2- and BCl3-Based Plasmas
- Etch Characteristics of GaN Using Inductively-Coupled Cl2/HBr and Cl2/Ar Plasmas
- Dry Etching of GaN Using Reactive Ion-Beam Etching and Chemically Assisted Reactive Ion-Beam Etching
- Development of GaN and InGaN Gratings by Dry Etching
- Plasma Damage Effects in InAlN Field-Effect Transistors
- ICP Dry Etching of III-V Nitrides
- Temperature Behavior of Pt/Au Ohmic Contacts to p-GaN
- Low Resistance Contacts to p-Type GaN
- InGaN/GaN/AlGaN-based laser diodes with modulation-doped strained-layer
superlattices grown on an epitaxially laterally overgrown GaN substrate
- Reactive ion etching of GaN layers using SF6
- Selective etching of wide bandgap nitrides
- Selective ICP etching of group III-nitrides in Cl2 andBCl3-based plasmas
- Etching of InP at >1μm·min−1 inCl2/Ar plasma chemistries
- Reactive ion etching of III-V semiconductors
- Selective dry etching of III-nitrides in Cl2/Ar,CH4/H2/Ar, ICl/Ar and IBr/Ar
- The dry etching of group III-nitride wide-bandgap semiconductors
- New plasma chemistries for etching GaN and InN: BI3 and BBr3
- Morphology of nickel and nickel/gold contacts to gallium nitride
- Reduction of Etch Pit Density in Organometallic Vapor Phase Epitaxy-Grown GaN on Sapphire by Insertion of a Low-Temperature-Deposited Buffer Layer between High-Temperature-Grown GaN
- Dopant-selective photoenhanced wet etching of GaN
- Selective Area Growth of GaN Directly on (0001) Sapphire by the HVPE Technique
- Evaluation of nanopipes in MOCVD grown (0001) GaN/Al2O3 by wet chemical etching
- Schottky Diodes on MOCVD Grown AlGaN Films.
- 300°ree;C GaN/AlGaN Heterojunction Bipolar Transistor
- Near Defect Free GaN Substrates
- Etch Processing of III-V Nitrides
- Damage-Free Photoassisted Cryogenic Dry Etching and Photoelectrochemical Wet Etching of GaN
- Characterization of InGaN/GaN-Based Multi-Quantum Well Distributed Feedback Lasers
- Ranges of Deposition Temperatures Applicable for Metalorganic Vapor Phase Epitaxy of GaN Films Via the Technique of Pendeo-Epitaxy
- Pendeo-Epitaxy - A New Approach for Lateral Growth of GaN Structures
- Effects of Surface Preparation on Epitaxial GaN on 6H-SiC Deposited Via MOCVD
- Nitridation of GaAs(001) Surface Studied by Auger Electron Spectroscopy
- Influence of the First Preparation Steps on the Properties of GaN Layers Grown on 6H-SiC by MBE
- Photoelectrochemical Etching of InxGa1-xN
- Inductively Coupled Plasma Etching of III-Nitrides in Cl2/Xe, Cl2/Ar and Cl2/He
- Focused Ion Beam Etching of GaN
- Fabrication of Smooth GaN-Based Laser Facets
- Group-III Nitride Etch Selectivity in Boron Trichloride/Chlorine ICP Plasmas
- Patterning III-N Semiconductors by Low Energy Electron Enhanced Etching (LE4)
- Dry and Wet Etching for Group III-Nitrides
- A GaN/4H-SiC heterojunction bipolar transistor with operation up to 300°C
- Thermal etching of binary and ternary III-V compounds under vacuum conditions
- Properties, processing and applications of GaN and related semiconductors
- Visible-Blind UV Digital Camera Based On a 32 x 32 Array of GaN/AlGaN p-i-n Photodiodes
- Characteristics of Inductively Coupled Cl2/BCl3 Plasmas during GaN Etching
- A study of GaN etch mechanism using the inductively coupled Cl2/Ar plasmas
- The facet formation of GaN-based device using chemically assisted ion beam etching(CAIBE) with photoresist mask
- EFFECTS OF INDUCTIVELY COUPLED PLASMA CONDITIONS ON THE ETCH PROPERTIES OF GaN AND OHMIC CONTACT FORMATIONS
- Etch characteristics of GaN using inductively coupled Cl2/Ar and Cl2/BCl3 plasmas
- EFFECTS OF PLASMA CONDITIONS ON THE ETCH PROPERTIES OF AlGaN
- A TEM Study of GaN Grown by ELO on (0001) 6H-SiC
- Preparation and Characterization of Single-Crystal Aluminum Nitride Substrates
- Surface Conversion Effects in Plasma-Damaged p-GaN
- A Comparative Study of GaN Diodes Grown by MBE on Sapphire and HVPE-GaN/Sapphire Substrates
- Wet Etching of Ion-Implanted GaN Crystals by AZ-400K Photoresist
- A Damage-Reduced Process Revealed by Photoluminescence in Photoelectrochemical Etching GaN
- Highly Chemical Reactive Ion Etching of Gallium Nitride
- Focused Ion Beam Etching of Nanometer-Size GaN/AlGaN Device Structures and Their Optical Characterization by Micro-Photoluminescence/Raman Mapping
- UV-Specific (320-365 nm) Digital Camera Based On a 128x128 Focal Plane Array of GaN/AlGaN p-i-n Photodiodes
- Solar-Blind AlGaN Heterostructure Photodiodes
- Origin of hexagonal-shaped etch pits formed in (0001) GaN films
- Inductively coupled plasma etching of GaN using BCl3/Cl2 chemistry and photoluminescence studies of the etched samples
- ICP Etching of GaN,
- Low Energy Electron Enhanced Etching of Semiconductors,
- Improved Sidewall Morphology on Dry Etched, SiO2 Masked GaN Features,
- Plasma Etch Induced Conduction Changes in GaN,
- A Review of Dry Etching of GaN and Related Materials
- The Effects of Reactive Ion Etching-Induced Damage on the Characteristics of Ohmic Contacts to n-Type GaN
- Gallium Nitride whiskers formed by selective photoenhanced wet etching of dislocations
- Dislocation Density of GaN Grown by Hydride Vapor Phase Epitaxy
- ICP Etching for the Fabrication of AlGaInN VCSELs with Dielectric Mirrors
- Evaluation of Dislocation Densities in n-GaN Films by Photoassisted Anodic Etching
- Photoassisted Anodic Etching of n-InN Films in an AGW Electrolyte
- Tree-like Features Formed on Photoelectrochemically Etched n-GaN Surfaces: Revelation of Threading Dislocations in GaN
- In-Situ Dry Etch Monitoring for GaN/AlGaN Based Device Structures
- A New KOH-Based UV Assisted Wet Etching Technique and its Application to AlGaN/GaN HFET Fabrication and Characterization
- Preparation of Atomically Flat Surfaces of Silicon Carbide Using Hydrogen Etching

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