References with contact in the title or abstract
- Growth of high optical and electrical quality GaN layers using low-pressure metalorganic chemical
vapor deposition
- Dry Etching and Implantation Characteristics of Iii-n Alloys
- Doping of GaAs Using SF6 Plasma Treatment
- SiC-a(3)n Alloys and Wide Band Gap Nitrides Grown on SiC Substrates
- Metal contacts to gallium nitride
- High barrier height GaN Schottky diodes: Pt/GaN and Pd/GaN
- Ion-implanted GaN junction field effect transistor
- A bilayer Ti/Ag ohmic contact for highly doped n-type GaN films
- Properties of Group III Nitrides
- Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologies
- Thermal stability of W ohmic contacts to n-type GaN
- Low Resistance Ohmic Contact to GaN with a Separate Layer Method
- Ohmic Contact Formation to Doped GaN
- Improved Uniformity of Ti/Al Ohmic Contacts to n-GaN Grown by MOCVD
- Ohmic Contacts to 6H-SiC based on TiC and Ni
- High-temperature ohmic contact to n-type 6H-SiC using nickel
- Low resistance ohmic contacts on wide band-gap GaN
- Nonalloyed ohmic contacts on GaN using InN/GaN short- period superlattices
- Ultraviolet and violet light-emitting GaN diodes grown by low-pressure metalorganic chemical vapor
deposition
- Deep level defects in n-type GaN
- Ti/Ni Ohmic Contacts to n-type Gallium Nitride
- Schottky contact and the thermal stability of Ni on n-type GaN
- Metal semiconductor field effect transistor based on single crystal GaN
- Monolithic Array of LEDs for the Generation of Light at Multiple Wavelengths and its use for Multicolor Display Applications
- Obtaining the Specific Contact Resistance from Transmission Line Model Measurements
- Growth and properties of scandium epitaxial films on GaN
- Hall measurements and contact resistance in doped GaN/AlGaN heterostructures
- Reactive molecular beam epitaxy of wurtzite GaN: Materials characteristics and growth kinetics
- Very low resistance multilayer Ohmic contact to n- GaN
- Nonlinear electroreflectance from gallium nitride using optical second-harmonic generation
- Study of Schottky barriers on n-type GaN grown by low- pressure metalorganic chemical vapor
deposition
- Schottky-based band lineups for refractory semiconductors
- Use of InN for Ohmic contacts on GaAs/AlGaAs heterojunction bipolar transistors
- Schottky barrier on n-type GaN grown by hydride vapor phase epitaxy
- Study of Schottky contacts on n-Ga0.51In0.49P by low-pressure metal-organic
chemical-vapor deposition
- Fabrication of GaN mesa structures
- Estimated Phase Equilibria in the Transition Metal-Ga-N Systems:Consequences for Electrical Contacts to GaN
- Specific contact resistance using a circular transmission line model
- Ohmic Contacts to n-Type GaN Using Pd/Al Metallization
- Microstructure of Ti/Al and Ti/Al/Ni/Au contacts for n-GaN
- Nonalloyed Ti/Al Ohmic contacts to n-type GaN using high-temperature premetallization anneal
- Cleaning of GaN Surfaces
- Schottky barrier properties of various metals on n-type GaN
- Microstructure, electrical properties, and thermal stability of Al ohmic contacts to n- GaN
- Metal-Semiconductor Contacts
- Barrier Heights of 3C- and 6H-SiC Schottky Contacts: Explanation by
the MIGS-and-Electronegativity Model
- Note On The Contact Between A Metal And An Insulator Or Semiconductor
- Surface States and Rectification at a Metal-Semiconductor Contact
- Role of Virtual Gap States and Defects in Metal-Semiconductor Contacts
- Lead Contacts on Si(111):H-1x1 surfaces
- Silver Schottky contacts on Si(111):H-1x1 surfaces prepared bywet-chemical etching
- Chemical trends of barrier heights in metal-semiconductor contacts:on the theory of the slope parameter
- Metal Contacts on α-GaN
- Thermal stability of W, WSix , and Ti/Al ohmic contacts to InGaN, InN, and InAlN
- Interfacial Reactions and Electrical Properties of Ti/n-GaN Contacts
- Microstructural stability of ohmic contacts to InxGa1-xN
- High temperature characteristics of Pd Schottky contacts on n-type GaN
- Ultra-low resistive ohmic contacts on n-GaN using Si-implantation
- Investigation of the mechanism for Ohmic contact formation in Al and Ti/Al contacts to n-type GaN
- Ohmic contacts to n-GaN using PtIn2
- Thermally stable PtSi Schottky contact on n-GaN
- 0.12-um gate III-V Nitride HFET's with high contact resistance
- InN-based Ohmic contacts to InAlN
- Low Resistance Bilayer Nd/Al Ohmic Contacts on n-Type GaN
- Investigation of Au Schottky contacts on GaN grown by molecular beam epitaxy
- High Frequency AlGaN/GaN MODFET's
- XPS study of Au/GaN and Pt/GaN contacts
- GaN based LED's with different recombination zones
- Degradation of blue AlGaN/InGaN/GaN LEDs subjected to high current pulses
- Effect of Dry Etching on Surface Properties of III-Nitrides
- Investigation of aluminium ohmic contacts to n-type GaN grown by molecular beam epitaxy
- Growth of Ternary Silicon Carbon Nitride as a New Wide Bandgap Material
- Optimization of III-N Based Devices Grown by RF Atomic Nitrogen Plasma Using In Situ Cathodoluminescence
- InxGa(1-x)N Alloys as Electronic Materials
- Substrate Effects on the Growth of InN
- Processing Challenges for GaN-Based Photonic and Electronic Devices
- Plasma Damage Effects in InAlN Field-Effect Transistors
- Current Transport in W and WSix Ohmic Contacts to InGaN and InN
- Temperature Behavior of Pt/Au Ohmic Contacts to p-GaN
- Low Resistance Contacts to p-Type GaN
- Phase Formation and Morphology in Nickel and Nickel/Gold Contacts to Gallium Nitride
- Morphology of nickel and nickel/gold contacts to gallium nitride
- Condensed Phase Equilibria in the Mo-Ga-N System at 800°C
- Ohmic Contact to P-Type GaN
- Metal contacts to n-type GaN
- Ultraviolet Photodetectors Based on AlxGa1-xN Schottky Barriers
- Thermally stable rhenium Schottky contacts to n-GaN
- Lateral Electron Current Operation of Vertical Cavity Surface Emitting Lasers with Buried Tunnel Contact Hole Sources
- Ohmic Contacts to n- and p-GaN
- Titanium and titanium nitride contacts to n-type gallium nitride
- Ohmic Contacts Formed by Electrodeposition and Physical Vapor Deposition on p-GaN
- Pyroelectric and Piezoelectric Properties of GaN-Based Materials
- Etch Processing of III-V Nitrides
- Visible and Infrared Rare-Earth Activated Electroluminescence From Erbium-Doped GaN
- Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs
- Pendeo-Epitaxy - A New Approach for Lateral Growth of GaN Structures
- Temperature Effect on the Quality of AlN Thin Films
- Defect States in SiC/GaN -and SiC/GaN /AlGaN- Heterostructures Characterized by Admittance and Photocurrent Spectroscopy
- DLTS Characterization of Defects Introduced During Sputter Deposition of Au Schottky Contacts on n-GaN
- Behavior of W and WSix Contact Metallization on n- and p-Type GaN
- Contact Resistance of InGaN/GaN Light Emitting Diodes Grown on the Production Model Multi-Wafer MOVPE Reactor
- NiIn As An Ohomic Contact To p-GaN
- Ni/Si-Based Contacts To GaN: Thermally Activated Structural Transformations Leading To Ohmic Behavior
- Contact Issues for GaN Technology
- Visible and infrared rare-earth-activated electroluminescence from indium tin oxide Schottky diodes to GaN:Er on Si
- Growth and fabrication of GaN/AlGaN heterojunction bipolar transistor
- Low resistance ohmic contacts on AlGaN/GaN structures using implantation and the "advancing" Al/Ti metallization
- Properties, processing and applications of GaN and related semiconductors
- Red light emission by photoluminescence and electroluminescence from Pr-doped GaN on Si substrates
- Red light emission by photoluminescence and electroluminescence from Eu-doped GaN
- Influence of pre-etching on specific contact parameters for metal-GaN contacts
- EFFECTS OF INDUCTIVELY COUPLED PLASMA CONDITIONS ON THE ETCH PROPERTIES OF GaN AND OHMIC CONTACT FORMATIONS
- Co-Doping Characteristics of Si and Zn with Mg in p-Type GaN
- High-Temperature Reliability of GaN Electronic Devices
- Characteristics of Ti/Pt/Au Ohmic Contacts on p-Type GaN/A1xGA1-xN Superlattices
- High-Quality Non-Alloyed Pt Ohmic Contacts to p-Type GaN Using Two-step Surface Treatment
- Zirconium Mediated Hydrogen Outdiffusion from p-GaN
- Pulsed-Laser-Deposited AlN Films for High-Temperature SiC MIS Devices
- Photoluminescence Characterization of Mg Implanted GaN
- Processing And Device Performance Of GaN Power Rectifiers
- The Microstructure and Electrical Properties of Directly Deposited TiN Ohmic Contacts to Gallium Nitride
- Improved Low Resistance Contacts of Ni/Au and Pd/Au to p-Type GaN Using a Cryogenic Treatment
- A Thermodynamic Approach to Ohmic Contact Formation to p-GaN
- Metal/GaN Contacts Studied by Electron Spectroscopies
- UV-Specific (320-365 nm) Digital Camera Based On a 128x128 Focal Plane Array of GaN/AlGaN p-i-n Photodiodes
- MICROSTRUCTURE AND THERMAL STABILITY OF TRANSITION METAL NITRIDES AND BORIDES ON GaN
- Approaches to designing thermally stable Scottky contacts to n-GaN
- Comparative study of GaN layers grown on insulating AlN and conductive AlGaN buffer layers
- Formation of Ti/Al ohmic contacts on Si-doped GaN epilayers by low temperature annealing
- A review of the metal-GaN contact technology
- Effect of Au overlayer on Ni contacts to p-type GaN
- High-temperature structural behavior of Ni/Au Contact on GaN(0001)
- Low resistance Pd/Au ohmic contacts to p-type GaN using surface treatment
- Ohmic contact formation mechanism of nonalloyed Pd contacts to p-type GaN observed by positron annihilation spectroscopy
- The Effects of Reactive Ion Etching-Induced Damage on the Characteristics of Ohmic Contacts to n-Type GaN
- Room Temperature Ohmic contact on n-type GaN using plasma treatment
- Epitaxial Lateral Overgrowth of GaN using Tungsten Nitride (WNx) Mask via MOVPE and Electrical Properties of WNx/GaN Contacts
- Nonuniform Contact Potential Profile of AlGaN/GaN on SiC Measured by Kelvin Probe Force Microscopy
- Ti-Based Ohmic Contacts to p-type GaN/AlxGa1-xN Superlattices
- Transparent Low Resistance Ohmic Contact to p-type GaN and its Application to GaN Based Light Emitting Diodes
- Low p-Type Contact Resistance Using Mg-Doped InGaN and InGaN/GaN Superlattices
- Formation of Low-Resistance, Thermally Stable, and Highly Transparent Pt-Based Ohmic Contacts to Surface-Treated p-GaN
- The Role of Annealing Ambient on the Formation of Ni/Au Ohmic Contacts to GaN LEDs
- Electrical Properties of Pd-Based Ohmic Contact to p-GaN with Au Diffusion Barrier
- Effect of Hydrogen Storage Materials on Ohmic Contact to p-GaN
- Electrical Properties and Reliabilities of Pt, PtAu, NiAu, and TaTi Ohmic Contact Materials for p-GaN
- Large Schottky Barriers and Memory Capability for Ni Contacts Formed on Low Mg-Doped p-GaN
- Low-resistance ohmic contacts to p-type GaN
- The effect of thermal annealing on the Ni/Au contact of p-type GaN
- Catalytic role of Au in Ni/Au contact on GaN(0001)
- Catalytic role of Au in Ni/Au contact on GaN(0001)

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© 1998 The Materials Research Society