Physical Review Letters 69(21), 3064 (1992).
A new x-ray structural technique, diffraction anomalous fine structure (DAFS), whcih combines the long-range order sensitivity of diffraction techniques with the short-range order sensitivity of absorption techniques, is described. We demonstrate that synchrotron DAFS measurements for the Cu(111) and Cu(222) Bragg reflections provide the same local atomic structural information as x-ray absorption fine structure and describe how DAFS can be used to provide enhanced site and spatial sensitivities for polyatomic and/or spatially modulated structures.
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Contributed by Chong Cook Kim from apnc108.216.216.211.in-addr.arpa. on Thursday, January 18, 2001 9:49:42 AM
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