Data for reference schubert-prb-56-13306

Infrared optical properties of mixed phase thin films studied by spectroscopic ellipsometry and boron nitride as an example

M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, F. Richter

Physical Review B 56, 13306 (1997).

This item is cited by the following items in the database:

  1. Optical phonons and free-carrier effects in MOVPE grown AlxGa1-xN measured by Infrared Ellipsometry
  2. Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry

Contributed by A submitted manuscript, on Tuesday, September 28, 1999 11:05:36 PM

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