Data for reference denninger-prb-55-5073

Determination of electric-field gradients in semiconductors with high precision and high sensitivity

G. Denninger, D. Reiser

Physical Review B 55, 5073 (1997).

This item is cited by the following items in the database:

  1. Defect Trapping and Annealing for Transition Metal Implants in Group III Nitrides

Contributed by A submitted manuscript, on Wednesday, May 17, 2000 10:09:20 AM

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