Data for reference kisielowski-prb-54-17745

Strain-related phenomena in GaN thin films

C. Kisielowski, J. Krüger, S. Ruvimov, T. Suski, J. W. Ager, E. Jones, Z. Lilienthal-Weber, M. Rubin, M. D. Bremser, R. F. Davis

Physical Review B 54, 17745 (1996).

This item is cited by the following items in the database:

  1. Effect of internal absorption on cathodoluminescence from GaN
  2. The Polarity of GaN: a Critical Review
  3. X-ray reciprocal lattice mapping and photoluminescence of GaN/GaAlN Multiple Quantum Wells; strain induced phenomena.
  4. Macro- and microstrains in MOCVD-grown GaN
  5. Growth Of High Quality GaN Thin Films By MBE On Intermediate-temperature Buffer Layers

Contributed by A submitted manuscript, on January 29, 1998 11:43:32 AM

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