Data for reference monemar-prb-10-676Fundamental energy gap of GaN from photoluminescence excitation spectra
B. Monemar
Physical Review B 10, 676 (1974).
This item is cited by the following items in the database:
- GaN, AlN, and InN: A review
- Free Excitons in GaN
- Electronic structure of biaxially strained wurtzite crystals GaN, AlN, and
InN
- Luminescence and Reflectivity of GaN/sapphire grown by MOVPE, GSMBE and
HVPE.
- Photoluminescence study on GaN homoepitaxial layers grown by molecular beam
epitaxy
- Photoluminescence excitation spectroscopy of GaN thin layers as a function of temperature
- Electronic band structures and effective-mass parameters of wurtzite GaN and InN
- Growth and Device Performance of GaN Schottky Rectifiers
- Compositional variation of AlGaN epitaxial films on 6H-SiC substrates determined by cathodoluminescence.
- Preparation of stoichiometric GaN(0001)-1×1: an XPS study
- Core-Level Photoemission From Stoichiometric GaN(0001)-1×1
Contributed by S. Strite
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