Data for reference dingle-prb-4-1211Absorption, reflectance, and luminescence of GaN epitaxial layers
R. Dingle, D. D. Sell, S. E. Stokowski, M. Ilegems
Physical Review B 4, 1211 (1971).
This item is cited by the following items in the database:
- GaN, AlN, and InN: A review
- ScAlMgO4: an Oxide Substrate for GaN Epitaxy
- Tunable Second-Harmonic Studies of GaN Films Near the Fundamental Band Edge
- Free Excitons in GaN
- Growth, Doping and Characterization of AlxGa1-xN Thin
Film Alloys on 6H-SiC(0001) Substrates
- Evidence for Shallow Acceptor Levels in MBE Grown GaN
- Electronic structure of biaxially strained wurtzite crystals GaN, AlN, and
InN
- Luminescence and Reflectivity of GaN/sapphire grown by MOVPE, GSMBE and
HVPE.
- Photoluminescence study on GaN homoepitaxial layers grown by molecular beam
epitaxy
- The Rate of Radiative Recombination in the Nitride Semiconductors and Alloys
- Photoluminescence excitation spectroscopy of GaN thin layers as a function of temperature
- Optical nonlinearities of Gallium Nitride
- Electronic band structures and effective-mass parameters of wurtzite GaN and InN
- Uniaxial Strain Effect on the Electronic and Optical Properties of Wurtzite GaN/AlGaN Quantum Well Lasers
- Photoluminescence, Magnetospectroscopy, and Resonant Electronic Raman Studies of Heteroepitaxial Gallium Nitride
- Free excitons in strained MOCVD-grown GaN layers
Contributed by S. Strite
If you are a registered user, and would like to help the journal improve
its references database, you can help by adding data to the database. The author list may be incomplete; the abstract
or title may be missing, and the list of references cited by the article is probably absent or incomplete.

last updated Thursday, April 28, 2005 10:36:17 AM.
© 1998 The Materials Research Society