Data for reference kyutt-nuovcimd-19-267

Application of X-ray diffraction in Laue geometry to imperfect near interface layerrs

R. N. Kyutt, T. S. Argunova

Nouvo Cimento della Societa Italiana di Fisica D, Condensed Matter, Atomic, Molecular and Chemical Physics 19, 267 (1997).

This item is cited by the following items in the database:

  1. Macro- and microstrains in MOCVD-grown GaN

Contributed by A submitted manuscript, on Monday, October 26, 1998 3:28:44 PM

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