Data for reference eckstein-nimb-27-78

Direct recoil sputtering and secondary ion production

W. Eckstein

Nuclear Instrumentation and Methods B 27, 78 (1987).

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  1. Time of Flight Mass Spectroscopy of Recoiled Ions Studies of Gallium Nitride Thin Film Deposition by Various Molecular Beam Epitaxial Methods

Contributed by A submitted manuscript, on Tuesday, September 15, 1998 4:04:03 PM

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