Materials Research Society Symposium Proceedings 468, 143 (1997).
Below is the abstract submitted to the meeting, not the abstract of the published paper:
Gallium nitride crystals were grown from Ga-based melt at an ambient pressure not exceeding 3 atm. Growth temperature was ∼1000°ree;C. The crystals are 2H-GaN having (0001) basal plane orientation. Crystal size varied from 0.05x0.05x0.01 mm to 2x2x0.1 mm. Lateral growth rate of the crystals ranged from 0.05 to 1 mm/hr. Normal growth rate was about 0.005 mm/hr. Depending on growth conditions, crystals have platelet or dendrite shape. The crystals were characterized by optical and electron microscopy, x-ray diffraction, photo- and cathodoluminescence, and optical absorption. Characteristics of the crystals will be presented.
This paper is part of Gallium Nitride and Related Materials II
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