Data for reference hammond-jvsta-13-136

Surface analysis at low to ultrahigh vacuum by ion scattering and direct recoil spectroscopy

M. S. Hammond, J. A. Schultz, A. R. Krauss

Journal of Vacuum Science and Technology A-Vacuum Surfaces and Films 13(3), 136 (1995).

The authors describe surface analytical methods designated as mass spectroscopy of recoiled ions (MSRI) and direct recoil spectroscopy (DRS).

This item is cited by the following items in the database:

  1. Time of Flight Mass Spectroscopy of Recoiled Ions Studies of Gallium Nitride Thin Film Deposition by Various Molecular Beam Epitaxial Methods

Contributed by A submitted manuscript, on Tuesday, September 15, 1998 4:22:52 PM

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