Data for reference bharatan-jvsta-12-1094

Structural characterization of GaN and GaAsxN1-x grown by electron cyclotron resonance-metalorganic molecular beam epitaxy Structural characterization of GaN and GaAs@/I[sub x]N@/I1-x

S. Bharatan, K. S. Jones, C. R. Abernathy, S. J. Pearton , F. Ren, P. W. Wisk, J. R. Lothian

Journal of Vacuum Science and Technology A-Vacuum Surfaces and Films 12(4), 1094 (1994).

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This item is cited by the following items in the database:

  1. Surface Morphology and Structure of GaNxAs1-x

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