Data for reference takayanagi-jvsta-3-1502

Structural analysis of Si(111)-7x7 by UHV-transmission electron diffraction and microscopy

K. Takayanagi, Y. Tanishiro, M. Takahashi, S. Takahashi

Journal of Vacuum Science and Technology A-Vacuum Surfaces and Films 3(3), 1502 (1985).

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This item is cited by the following items in the database:

  1. Nucleation of AlN on the (7×7) Reconstructed Silicon (1 1 1) Surface

Contributed by A submitted manuscript, on Friday, July 31, 1998 12:44:54 AM

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