Data for reference gaunean-jpp-45-119

Application of Cesium Primary Beam to the Characterisation of III-V Semicoductors by SIMS

M. Gaunean, R. Chaplain, A. Rupert

Journal de Physique 45(C2), 119 (1984).

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This item is cited by the following items in the database:

  1. In-depth Analysis of the Impurities in GaN

Contributed by A submitted manuscript, on Tuesday, July 16, 1996 10:16:27 AM

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