Data for reference edgar-jmatsci-8-307

Hardness, elastic modulus and structure of indium nitride thin films on AlN-nucleated sapphire substrates.

James H. Edgar, C. H. Wei, D. T. Smith, T. J. Kistenmacher, W. A. Bryden

Journal of Materials Science 8, 307 (1997).

This item is cited by the following items in the database:

  1. Hardness of bulk single-crystal GaN and AlN

Contributed by A submitted manuscript, on Monday, August 12, 2002 12:53:07 PM

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