Data for reference nishida-jjap-37-l459

Step-Flow Metalorganic Vapor Phase Epitaxy of GaN on SiC Substrates

T Nishida, T Akasaka, N Kobayashi

Japanese Journal of Applied Physics 37(4B), L459 (1998).

Metalorganic Vapor Phase Epitaxy (MOVPE) growth of GaN on SiC substrates is dominated by the step-flow growth mode within a 10 µm2 area. Compared to the growth on sapphire substrates, there is no spiral growth originating from screw dislocations and two dimensional islands within the 10 µm2 area, showing that the step-flow growth mode is dominant. The surface mostly consists of 140-nm-wide atomic terraces and doubly stacked monolayers (DSM) corresponding to a unit cell height. This coupling of DSM dissolves into a pair of monolayer steps at the adjacent DSM steps forming a twilled step (TWS) structure, due to the asymmetry between these two layers in a GaN unit cell.

This item is cited by the following items in the database:

  1. Structural and optical properties of GaN laterally overgrown on Si(111) by metalorganic chemical vapor deposition using an AlN buffer layer

Contributed by A.E. Nikolaev from 157.197.128.233 on June 12, 1998 6:06:14 AM


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