Data for reference yu-jjap-36-l1029

Polarized reflectance spectroscopy and spectroscopic ellipsometry determination of the optical anisotropy of GaN on sapphire

G. Yu, H. Ishikawa, T. Egawa, T. Soga, J. Watanabe, T. Jimbo, M. Umeno

Japanese Journal of Applied Physics 36(8A), l1029 (1997).

Refractive index measurements

This item is cited by the following items in the database:

  1. Spectroscopic Ellipsometry on GaN: Comparison Between Hetero-epitaxial Layers and Bulk Crystals

Contributed by S. Strite from internet-gateway-x.zurich.ibm.com. on August 15, 1997 10:02:46 AM

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