Japanese Journal of Applied Physics 36(9AB), L1133 (1997).
GaN epitaxial layers were grown by metalorganic hydrogen chloride vapor phase epitaxy (MOH-VPE) using double GaN buffer layers on GaAs substrate. In this method, the first GaN buffer layer was deposited on GaAs(111)B substrate at 550oC, and after annealing at 850oC for 10min, the second buffer layer was deposited at 500oC. Then the GaN epitaxial layer was grown at 850oC. The X-ray full width at half maximum (FWHM) value of the obtained hexagonal GaN was smaller than that of a GaN epitaxial layer with a single buffer layer. The room temperature photoluminescence spectra exhibited a strong peak at approximately 361.5nm.
Contributed by A.E. Nikolaev from www-proxy.ioffe.rssi.ru. on November 23, 1997 5:22:26 AM
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