Data for reference tanaka-jjap-36-1062

Morphologyabd X-ray Diffraction Peak Widths of Aluminum Nitride Single CrystalsPrepared by the Sublimation Method

M. Tanaka, S. Nakahata, K. Sogabe, H. Nakata, M. Tobioka

Japanese Journal of Applied Physics 36, 1062 (1997).

This item is cited by the following items in the database:

  1. New Technique for Sublimation Growth of AlN Single Crystals

Contributed by A submitted manuscript, on Thursday, March 8, 2001 9:39:42 AM

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