Data for reference fujieda-jjap-28-l16

Effects of In- surface treatment on the electrical properties and structures of AlN/n-In- interface

S. Fujieda, K. Akimoto, I. Hirosawa, J. Mizuki, Y. Matsumoto, J. Matsui

Japanese Journal of Applied Physics 28, L16 (1989).

This item is cited by the following items in the database:

  1. GaN, AlN, and InN: A review

Contributed by S. Strite

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