Data for reference steckl-jem-26-217Growth and characterization of GaN thin films on SiC SOI substrates
A.J. Steckl, J. Devrajan, C. Tran, R.A. Stall
Journal of Electronic Materials 26(3), 217 (1997).
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Contributed by A. T. Ping from escobar.ccsm.uiuc.edu. on Wednesday, April 2, 1997 11:28:16 PM
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