Data for reference donovan-jem-26-1292

The Role of Ion Characteristics in Determining the Structural and Electrical Quality of InN Grown by Metalorganic Molecular Beam Epitaxy

SM Donovan, JD MacKenzie, CR Abernathy, SJ Pearton, PC Chow, J Van Hove

Journal of Electronic Materials 26(11), 1292 (1997).

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Contributed by A.E. Nikolaev from www-proxy.ioffe.rssi.ru. on November 23, 1997 5:08:18 AM

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