Data for reference kum-jem-26-1098

The Effect of Substrate Surface Roughness on GaN Growth Using MOCVD Process

D Kum, D Byun

Journal of Electronic Materials 26(10), 1098 (1997).

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Contributed by A.E. Nikolaev from www-proxy.ioffe.rssi.ru. on October 4, 1997 6:17:35 AM

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