Data for reference shintani-jecs-125-2076

X-ray diffraction topography and crystal characterization of GaN epitaxial layers for light emitting diodes

A. Shintani, Y. Takano, S. Minagawa, M. Maki

Journal of the Electrochemical Society 125, 2076 (1978).

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This item is cited by the following items in the database:

  1. GaN, AlN, and InN: A review

Contributed by S. Strite

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