Data for reference zou-jap-92-2534

Thermal conductivity of GaN films: Effects of impurities and dislocations

J. Zou, D. Kotchetkov, A. A. Balandin, D. I. Florescu, F. H. Pollak

Journal of Applied Physics 92, 2534 (2002).

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This item is cited by the following items in the database:

  1. The Effect of the Thermal Boundary Resistance on Self-Heating of AlGaN/GaN HFETs
  2. The Ambient Temperature Effect on Current-Voltage Characteristics of Surface-Passivated GaN-Based Field-Effect Transistors

Contributed by A submitted manuscript, on Tuesday, May 27, 2003 2:48:25 PM

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