Data for reference wright-jap-82-5259

Basal-plane stacking faults and polymorphism in AlN, GaN, and InN

A. F. Wright

Journal of Applied Physics 82(10), 5259 (1997).

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This item is cited by the following items in the database:

  1. Polarization and band offsets of stacking faults in AlN and GaN

Contributed by A submitted manuscript, on Tuesday, July 28, 1998 10:28:23 AM

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