Data for reference bykhovski-jap-81-6332

Elastic strain relaxation and piezoeffect in GaN-AlN, GaN-AlGaN and GaN-InGaN superlattices

A. D. Bykhovski, B. L. Gelmont, M. S. Shur

Journal of Applied Physics 81(9), 6332 (1997).

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This item is cited by the following items in the database:

  1. X-ray reciprocal lattice mapping and photoluminescence of GaN/GaAlN Multiple Quantum Wells; strain induced phenomena.

Contributed by A submitted manuscript, on Tuesday, July 21, 1998 12:01:04 PM

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