Data for reference cole-jap-80-278

Thermal stability of W ohmic contacts to n-type GaN

MW Cole, DW Eckart, WY Han, RL Pfeffer, T Monahan, F Ren, C Yuan, RA Stall, SJ Pearton, Y Li, Y Lu

Journal of Applied Physics 80(1), 278 (1996).

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This item is cited by the following items in the database:

  1. Thermal stability of W, WSix , and Ti/Al ohmic contacts to InGaN, InN, and InAlN
  2. MICROSTRUCTURE AND THERMAL STABILITY OF TRANSITION METAL NITRIDES AND BORIDES ON GaN

Contributed by Andrej E. Nikolaev from shuttle.ioffe.rssi.ru. on Sunday, June 30, 1996 9:06:55 AM

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