Data for reference sun-jap-76-236

Thermal stability of GaN thin films grown on (0001) Al2O3, (0112) Al2O3 and (0001)Si 6H-SiC substrates

C. J. Sun, P. Kung, A. Saxler, H. Ohsato, E. Bigan, M. Razeghi , D. K. Gaskill

Journal of Applied Physics 76(1), 236 (1994).

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This item is cited by the following items in the database:

  1. Identification of a Cubic Phase in Epitaxial Layers of Predominantly Hexagonal GaN
  2. The Polarity of GaN: a Critical Review
  3. Review of polarity determination and control of GaN

Contributed by Andrei Nikolaev from shuttle.ioffe.rssi.ru

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