Data for reference khan-jap-73-3108

Deposition and surface characterization of high quality single crystal GaN layers

M. Asif Khan, J. N. Kuznia, D. T. Olson , R. Kaplan

Journal of Applied Physics 73(6), 3108 (1993).

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This item is cited by the following items in the database:

  1. The Polarity of GaN: a Critical Review
  2. Review of Structure of Bare and Adsorbate-Covered GaN(0001) Surfaces
  3. Compositional variation of AlGaN epitaxial films on 6H-SiC substrates determined by cathodoluminescence.

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