Data for reference itoh-jap-58-1828

Study of cracking mechanism in GaN/alpha -Al2O3 structure

Nobuo Itoh, Jung Chul Rhee , Toshiharu Kawabata, Susumu Koike

Journal of Applied Physics 58(5), 1828 (1985).

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This item is cited by the following items in the database:

  1. Relaxation Process of the Thermal Strain in the GaN/Al2O3 Heterostructure and Determination of the Intrinstic Lattice Constants of GaN Free from the Strain

Contributed by Andrei Nikolaev from shuttle.ioffe.rssi.ru


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