Data for reference seah-jap-56-2106

Atomic mixing and electron range effects in ultrahigh-resolution profiles of the Ta2O5/Ta interface by argon sputtering with Auger electron spectroscopy

M. P. Seah, C. P. Hunt

Journal of Applied Physics 56(7), 2106 (1984).

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This item is cited by the following items in the database:

  1. XPS study of Au/GaN and Pt/GaN contacts

Contributed by A submitted manuscript, on Friday, June 20, 1997 2:36:46 PM

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