Data for reference homma-jap-56-1892

Secondary Ion Mass Spectrometry Analysis of Impurity Distribution Across Liquid Encapsulated Czochralski GaAs Wafers

Y. Homma, Y. Ishii

Journal of Applied Physics 56(6), 1892 (1984).

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This item is cited by the following items in the database:

  1. In-depth Analysis of the Impurities in GaN

Contributed by A submitted manuscript, on Tuesday, July 16, 1996 10:16:31 AM

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