Data for reference kuphal-jap-50-4196

Composition and refractive index of Ga1-xAlxAs determined by ellipsometry

E. Kuphal, H. W. Dinges

Journal of Applied Physics 50, 4196 (1979).

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This item is cited by the following items in the database:

  1. Spectroscopic Ellipsometry on GaN: Comparison Between Hetero-epitaxial Layers and Bulk Crystals

Contributed by A submitted manuscript, on Thursday, September 10, 1998 3:31:46 PM

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