Data for reference camphausen-jap-42-4438

Pressure and temperature dependence of the absorption edge in GaN

D. L. Camphausen, G. A. N. Connell

Journal of Applied Physics 42, 4438 (1971).

The Materials Research Society does not yet have permission from the copyright owner to make the abstract available.

This item is cited by the following items in the database:

  1. GaN, AlN, and InN: A review
  2. Electronic structure of biaxially strained wurtzite crystals GaN, AlN, and InN
  3. Growth and Device Performance of GaN Schottky Rectifiers

Contributed by S. Strite


If you are a registered user, and would like to help the journal improve its references database, you can help by adding data to the database. The author list may be incomplete; the abstract or title may be missing, and the list of references cited by the article is probably absent or incomplete.


MRS Internet Journal of Nitride Semiconductor Research

last updated Wednesday, April 27, 2005 7:36:39 PM.
© 1998 The Materials Research Society