Data for reference nahm-bookarticle-2000-34Structural and Optical Characterization of Thick GaN Films Grown by Direct Reaction of Ga and NH3
Kee Suk NAHM, Seung Hyun YANG, Sang Hyun AHN, Eun-Kyung SUH, Kee Young LIM
published by IPAP Conference Series 1(Tokyo), 34 (2000).
ISBN 4-900526-13-4
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http://www.ipap.jjap.or.jp/proc/cs1/pdf/cs1_9.pdf
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