Data for reference foley-applsurfsci-22/23-663Morphology and structure of indium nitride films
C. P. Foley, T. L. Tansley
Applied Surface Science 22/23, 663 (1985).
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This item is cited by the following items in the database:
- GaN, AlN, and InN: A review
- InN thin film growth using N2, NH3 and N2-He rf plasma
Contributed by S. Strite
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