Data for reference fini-apl-76-3893

In-situ, Real-Time Measurement of Wing Tilt During Lateral Epitaxial Overgrowth of GaN,

P. Fini, A. Munkholm, C. Thompson, G. B. Stephenson, J. A. Eastman, M. V. Ramana Murty, O. Auciello, L. Zhao, S. P. DenBaars, J. S. Speck

Applied Physics Letters 76, 3893 (2000).

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This item is cited by the following items in the database:

  1. Review of Pendeo-Epitaxial Growth and Characterization of Thin Films of GaN and AlGaN Alloys on 6H-SiC(0001) and Si(111) Substrates

Contributed by A submitted manuscript, on Tuesday, September 25, 2001 6:27:33 PM

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