Data for reference kim-apl-76-3864

Thermal boundary resistance at Ge2Sb2Te5/ZnS:SiO2 interface

E. -K. Kim, S. -I. Kwun, S. -M. Lee, H. Seo, J. -G. Yoon

Applied Physics Letters 76(26), 3864 (2000).

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This item is cited by the following items in the database:

  1. The Effect of the Thermal Boundary Resistance on Self-Heating of AlGaN/GaN HFETs

Contributed by A submitted manuscript, on Tuesday, May 27, 2003 2:48:49 PM

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