Data for reference smith-apl-72-2114

Determination of wurtzite GaN lattice polarity based on surface reconstruction

A. R. Smith, R. M. Feenstra, D. W. Greve, M. S. Shin, M. Skowronski, J. Neugebauer, J. E. Northrup

Applied Physics Letters 72(17), 2114 (1998).

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This item is cited by the following items in the database:

  1. The Polarity of GaN: a Critical Review
  2. Surface Reconstruction during Molecular Beam Epitaxial Growth of GaN (0001)
  3. Structure and composition of GaN (0001) A and B surfaces
  4. Growth Of High Quality GaN Thin Films By MBE On Intermediate-temperature Buffer Layers
  5. Structural Properties of GaN Films Grown by Molecular Beam Epitaxy on Singular and Vicinal 6H-SiC(0001)

Contributed by A submitted manuscript, on Tuesday, May 19, 1998 5:07:13 PM

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