Data for reference korakakis-apl-72-1004

X-ray characterization of GaN/AlGaN multiple quantum wells for ultraviolet laser diodes

D. Korakakis, K. F. Ludwig, T. D. Moustakas

Applied Physics Letters 72(9), 1004 (1998).

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This item is cited by the following items in the database:

  1. X-ray reciprocal lattice mapping and photoluminescence of GaN/GaAlN Multiple Quantum Wells; strain induced phenomena.

Contributed by A submitted manuscript, on Tuesday, July 21, 1998 11:59:27 AM

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