Data for reference tang-apl-70-3206

Dispersion properties of aluminum nitride as measured by an optical waveguide technique

Xiao Tang, Kobachat Wonchotigul , Michael G. Spencer

Applied Physics Letters 70(24), 3206 (1997).

Refractive index and waveguide attenuation was determined for AlN waveguide produced on a sapphire substrate. A dispersion curve was obtained from these measurements and compared with literature data.

This item cites the following items in the database:

  1. InGaN-Based Multi-Quantum-Well-Structure Laser Diodes
  2. High-responsivity photoconductive ultraviolet sensors based on insulating single-crystal GaN epilayers
  3. The dispersion of the refractive index and the birefringence of AlN

Contributed by Michael Spencer from 138.238.128.150 on July 29, 1997 12:26:41 PM

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