Data for reference osinski-apl-69-898AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress
M Osinski, J Zeller, PC Chiu, BS Phillips, DL Barton
Applied Physics Letters 69(7), 898 (1996).
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This item is cited by the following items in the database:
- Aging Mechanisms of InGaN/AlGaN/GaN Light-Emitting Diodes Operating at High Currents
Contributed by A.E. Nikolaev from shuttle.ioffe.rssi.ru. on Saturday, September 7, 1996 8:58:33 AM
Modified by A.E. Nikolaev from shuttle.ioffe.rssi.ru. on Saturday, September 21, 1996 3:19:16 PM
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