Data for reference leszczynski-apl-69-73Lattice parameters of gallium nitride
M. Leszczynski, H. Teisseyre, T. Suski, I. Grzegory, M. Bockowski, J. Jun, S. Porowski, K. Pakula, J. M. Baranowski , C. T. Foxon, T. S. Cheng
Applied Physics Letters 69(1), 73 (1996).
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This item is cited by the following items in the database:
- Growth, Doping and Characterization of AlxGa1-xN Thin
Film Alloys on 6H-SiC(0001) Substrates
- Photoluminescence study on GaN homoepitaxial layers grown by molecular beam
epitaxy
- Hardness and fracture toughness of bulk single crystal gallium nitride
- Physical Properties of Bulk GaN Crystals Grown by HVPE
Contributed by Andrej E. Nikolaev from shuttle.ioffe.rssi.ru. on Sunday, June 30, 1996 7:46:32 AM
Modified by Andrei Nikolaev from shuttle.ioffe.rssi.ru
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